-40%
JEOL Inspection Stage Chamber Gate Assembly JWS-7555S Wafer Review SEM Spare
$ 533.9
- Description
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Description
JEOL Inspection Stage Chamber Gate Assembly JWS-7555S Wafer Review SEM SpareInventory # CONF-1162
Part No: Wafer Chamber Gate Assembly
Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System
Installed Component
CKD Part No: CMK2-M-40-50
This JEOL Inspection Stage Chamber Gate Assembly JWS-7555S Wafer Review SEM Spare is used working surplus. Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.
Sale Details
Item Condition:
Used Working, 90 Day Warranty
Estimated Packed Shipping Dimensions:
L x W x H = 20"x20"x20" @ 14 lbs.
Only items pictured are included:
If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
For items with multiple quantities:
The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
Items are sold with a
90-Day Satisfaction Guarantee
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